Subwavelength Optics: Theory and Technology

CHARACTERIZATIONS

Author(s): Yongqi Fu

Pp: 75-89 (15)

DOI: 10.2174/978160805050510901010075

* (Excluding Mailing and Handling)

Abstract

Approaches for characterization of plasmonic structures were presented in this chapter. Firstly, scanning probing microscopy-based geometrical method was introduced. Probing problems for the commercial probes were addressed. Then we gave a major part for illustration of optical characterization of the plasmonic structures, including near-field scanning optical microscope, Raman spectroscopy, confocal microscopy, and multiphoton microscopy.

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