Abstract
In recent years, Time of Flight-Secondary Ion Mass Spectrometry (TOFSIMS) has been widely employed as a powerful surface characterization tool in secondary battery investigations. In this chapter, we introduced the essential working principle, fundamental functions, and basic components of TOF-SIMS, which hopefully could provide useful insights for potential users and readers with particular interests in TOF-SIMS measurement. Additionally, state-of-the-art practical applications and research progress of TOF-SIMS in secondary batteries, including electrode materials and electrode/electrolyte interfaces, were thoroughly reviewed and discussed.
Keywords: Depth profiling, Mapping, Secondary batteries, Three-dimensional reconstruction, TOF-SIMS.
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