This work describes the methodology and the basic procedures developed by the patent entitled Method and Device for Measuring Characteristic Curves in Photovoltaic Systems . The invention relates to a measuring device that can capture the current-voltage (I-V) and power-voltage (P-V) characteristic curves of solar cells, photovoltaic (PV) modules or arrays. The patented system employs a novel circuit solution based on DC-DC converters that shows several advantages with regard to classical methods: simple structure, scalability, fast response and low cost. The patented system allows the real time capture and displaying of the I-V and P-V curves of a PV panel or array. Moreover, the patented system allows the real time capture and displaying of pieces of curves which are not connected to each other. An experimental prototype based on four SEPIC (Single-Ended Primary Inductance Converter) converters in parallel connection operating in interleaved mode has been implemented to validate the patented system.