A Review of Recent In Situ Deformation Studies Using Synchrotron X-Ray (Micro) Beams

Author(s): Alexander M. Korsunsky, Felix Hofmann, Xu Song, Brian Abbey, Nikolaos Baimpas

Journal Name: Micro and Nanosystems

Volume 4 , Issue 2 , 2012

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The advent of (sub)microscopic focused X-ray beams at third generation synchrotron sources has opened up possibilities for the characterisation of material structure and mechanical behaviour with unprecedented spatial resolution. Crucially, the non-destructive nature and fast rate of X-ray data collection allow in situ deformation to be studied. In this review, we concentrate on the inelastic deformation response of ductile metallic (poly)crystals. We describe a range of diffraction-based techniques we have developed including monochromatic beam reciprocal space mapping, scanning “pink” beam micro-diffraction compound topography, and white beam Laue micro-diffraction. We compare the results obtained using each of the above techniques, and assess and review the insights that they afford into micro-scale material deformation.

Keywords: Synchrotron, X-ray diffraction, micro-beam, dislocation

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Article Details

Year: 2012
Published on: 06 May, 2012
Page: [97 - 105]
Pages: 9
DOI: 10.2174/1876402911204020097
Price: $25

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