The advent of (sub)microscopic focused X-ray beams at third generation synchrotron sources has opened up
possibilities for the characterisation of material structure and mechanical behaviour with unprecedented spatial resolution.
Crucially, the non-destructive nature and fast rate of X-ray data collection allow in situ deformation to be studied. In this
review, we concentrate on the inelastic deformation response of ductile metallic (poly)crystals. We describe a range of
diffraction-based techniques we have developed including monochromatic beam reciprocal space mapping, scanning
“pink” beam micro-diffraction compound topography, and white beam Laue micro-diffraction. We compare the results
obtained using each of the above techniques, and assess and review the insights that they afford into micro-scale material