Evaluation of Instrument Broadening
Pp. 112-117 (6)
Continuing discussions on the topic of small-size and strain-broadenings, this chapter deals with the extraneous
broadening due to instrument-geometrical effects. The newly developed model is of particular importance in the size
and/or strain determinations, not only because it extensively meets the 2D X-ray diffraction techniques in many types
of X-ray analysis, but also because it has the superiority over other existing methods for the measurement of diffraction
profiles. The present series studies have greatly improved the precision of the determination of line breadth.
In order to discuss the extraneous broadening arisen from instrument geometry effects, we would like to outline
briefly the basic principle on which the broadening is based and to give the formation of an actual profile by
intensity data observed.....