Multifunctional Two- and Three-Dimensional Polycrystalline X-Ray Diffractometry

Qualitative Phase Analysis

Author(s): Cong Qiuzi, Yu Xiang and He Li

Pp: 42-52 (11)

DOI: 10.2174/978160805076511101010042

Abstract

IDENTIFICATION OF PHASES

The qualitative identification of phase depends, ultimately, upon the measurement of the precise locations and intensities of the diffraction lines. Interplanar spacings corresponding to the diffracted X-rays are to be found first, and then intensities are measured either by a diffractometer, which can give excellent results, when the Ni- or singlecrystal monochromator is used as the filter.

Principle of Superposition of X-Ray Patterns

It is well-known that X-rays diffracted by incoherent planes are according to the principle of superposition of intensities. The same principle is followed by X-ray patterns produced from different crystalline substances. Considering a system consisting of two phases denoted by capital letters, and let the same notation represent their fingerprints as peaks, then....

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