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Approaches for characterization of plasmonic structures were presented in this chapter. Firstly, scanning probing
microscopy-based geometrical method was introduced. Probing problems for the commercial probes were addressed. Then we gave a
major part for illustration of optical characterization of the plasmonic structures, including near-field scanning optical microscope,
Raman spectroscopy, confocal microscopy, and multiphoton microscopy.
School of Physical Electronics University of Electronic Science and Technology of China.