Residual Life Prediction of RF Oscillator Under Accelerated Stress Failure Condition

Author(s): Yiwen Long*, Zhen Liu, Chenglin Yang, Xiuyun Zhou, Qianyang Duan

Journal Name: Recent Advances in Electrical & Electronic Engineering
Formerly Recent Patents on Electrical & Electronic Engineering

Volume 11 , Issue 3 , 2018


Become EABM
Become Reviewer
Call for Editor

Graphical Abstract:


Abstract:

Background: Crystal oscillator plays a major role in the RF system as the frequency source while often encountered in vibration condition. In order to maintain the normal operation of the system, implementing estimation and prediction is necessary as a strategy based on performance degradation. However, there is little research addressing the issues associated with health status evaluation and Residual Useful Life (RUL) prediction of the RF crystal oscillator.

Methods: This paper proposes a method to assess the health status and the RUL tested in a case study under vibration condition.

Conclusion: Our approach utilizes acceleration sensitivity(AS) as indicator and the M-estimation based optimally-pruned extreme learning machine (M-OPELM) as technology, obtaining ideal predicting results according to the actual RUL.

Keywords: RUL, acceleration sensitivity, RF oscillator, M-OPELM, accelerated stress failure, phase noise.

Rights & PermissionsPrintExport Cite as

Article Details

VOLUME: 11
ISSUE: 3
Year: 2018
Published on: 31 July, 2018
Page: [286 - 290]
Pages: 5
DOI: 10.2174/2352096511666180214122906
Price: $25

Article Metrics

PDF: 12
HTML: 1