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Current Nanoscience

Editor-in-Chief

ISSN (Print): 1573-4137
ISSN (Online): 1875-6786

An Active CNTFET Model for RF Characterization Deduced from S Parameters Measurements

Author(s): Roberto Marani, Gennaro Gelao, Pasquale Soldano and Anna Gina Perri

Volume 11, Issue 1, 2015

Page: [36 - 40] Pages: 5

DOI: 10.2174/1573413710666140909203046

Price: $65

Abstract

In this paper a procedure for RF characterization of Carbon NanoTube Field Effect Transistors is illustrated and applied to a back-gate CNTFET. S parameters measurements up to 12 GHz are performed and a new lumped element active two-port network is proposed and deduced from these measurements. To obtain the intrinsic RF behavior of the device, we perform a straightforward static de-embedding procedure, applicable to any other CNTFET structures. In this way it is possible to evaluate the intrinsic model to implement directly in simulation software for electronic circuits CAD.

Keywords: Carbon nanotube field effect transistors (CNTFETs), nanoelectronic devices, nanotechnology, modelling, RF characterization, S parameters measurements.

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