Reprint
Journal Title :  Recent Advances in Electrical & Electronic Engineering

Volume:  10

Issue:  2

Article Title :  Analytical Modeling of Threshold Voltage and Drain-Induced-Barrier- Lowering Variations Due to Gate Length Fluctuation in Nanometer MOSFETs

Page No :  128   To   133

Total Pages :   6

Reprint Order Form
Note: Separate with comma e.g. 1,2,5
[?]