Near Infrared Spectroscopy Patents for the Physicochemical Characterization of Nanomaterials: The Road from Production to Routine High-Throughput Quality Control

Author(s): C. W. Huck, C. Pezzei, V. A. Huck-Pezzei, J. D. Pallua, S. A. Schoenbichler, L. K. Bittner, G. K. Bonn.

Journal Name: Recent Patents on Nanotechnology

Volume 6 , Issue 2 , 2012


The measurement of the physical and chemical (“physicochemical”) properties of nanomaterials used in industry and science including chemistry, pharmacy, medicine, toxicology, etc., is time-consuming, expensive and requires a lot of experience of a well trained lab staff. Near-infrared spectroscopy (NIR; 4.000-12.000 cm-1), working in the wavelength region with the highest IR energy, allows obtaining multifactorial information of the material under investigation due to the occurrence of a high number of combination and overtone vibrations. Coupling of an optimized and well-designed measurement technique with multivariate data analysis (MVA) leads to a non-destructive, fast, reliable and robust novel NIR technique for the fast and non-invasive physicochemical characterization, which is suitable for high-throughput quality control due to the short analyses times of only a few seconds. In the following chapters, the patented basic NIR techniques full-filling these aims are introduced, described, summarized and critically discussed.

Keywords: Physicochemical Characterization, High-Throughput Quality Control, Near-infrared spectroscopy, robust novel, Brunauer-Emett-Teller, electron microscopy, dynamic learning vector quantization, MALDI, matrix assisted laser desorption ionization, multiplicative scattering correction, mass spectrometry, multivariate data analysis, principal component analysis, principal component regression, partial least square regression

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Article Details

Year: 2012
Page: [135 - 141]
Pages: 7
DOI: 10.2174/187221012800270171
Price: $58

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