Background: Se-based chalcogenide glasses have wide commercial applications
such as switching, optical memory devices and xerography because of their behaviour as
phase change material. Thermal characterisation behaviour of bulk chalcogenide glass
In4Se84S12 has been studied by Differential Scanning Calorimetry (DSC) under nonisothermal
conditions at four different heating rates 5°C/min, 10°C/min, 15°C/min and
20°C/min. The glass transition temperature (Tg), crystallisation temperature (Tc) and melting
temperature (Tm) have been determined through DSC thermograms.
Method: The activation energy for structural relaxation (ΔEt) is determined by Moynihan
method. The activation energy of crystallization (ΔEc) is estimated by Kissinger and Ozawa
equations under non-isothermal condition and order parameter (n) by using Johnson–Mehl–
Arvami (JMA) model. Surface morphological analysis of thin film has been carried out by
Scanning Electron Microscope (SEM) which depicts the development of grains.
Results: Energy Dispersive Analysis by X-ray (EDX) analysis shows the perfect compositional
elements in the alloy. X-ray Diffraction (XRD) of alloy sample has no sharp peaks
which reflects that the alloy is amorphous.
Conclusion: Based on thermal analysis, it is found that chalcogenide glass In4Se84S12 is
thermally stable at 20°C /min and can be used in various solid state devices.