Surface Defects Inspection Method for the Medium and Heavy Plate

Author(s): Zimiao Zhang, Shihai Zhang, Qiu Li.

Journal Name: Recent Patents on Mechanical Engineering

Volume 9 , Issue 3 , 2016

Become EABM
Become Reviewer

Abstract:

Background: The medium and heavy plate surface defects can be divided into two categories. One is the defects without the depth changes. Such defects are called closed defects. The other is the defects with the depth changes. Such defects are called open defects.

Objective: The purpose of this study is to provide an efficient patent for the open defects detection of medium and heavy plate.

Method: A defects detection patent is proposed based on the theory of color photometric stereo. A single multi-spectral line scan camera with a white line light source is used to obtain the image of the medium and heavy plate surface. The determination algorithm for open defects is presented and the image processing algorithm is also studied.

Results: The possibility of the presented patent is verified through industrial application experiments in a steel plant. Experimental results show that the patent can realize online detection for the medium and heavy plate surface open defects promptly and accurately.

Conclusion: The defects with the depth changes are called the open defects. The patent proposed in this paper provides a new way of surface open defects inspection based on machine vision.

Keywords: Color photometric stereo, determination algorithm, image processing, multi-spectral line scan camera, open defects, surface defects, the medium and heavy plate.

Rights & PermissionsPrintExport Cite as

Article Details

VOLUME: 9
ISSUE: 3
Year: 2016
Page: [255 - 258]
Pages: 4
DOI: 10.2174/2212797609666160630112150
Price: $58

Article Metrics

PDF: 15
HTML: 5
EPUB: 1