Understanding Molecular Mechanisms of Durable and Non-durable Resistance to Stripe Rust in Wheat Using a Transcriptomics Approach
Stripe rust of wheat, caused by Puccinia striiformis f. sp. tritici, continues to cause severe damage worldwide.
Durable resistance is necessary for sustainable control of the disease. High-temperature adult-plant (HTAP) resistance,
which expresses when the weather becomes warm and plants grow older, has been demonstrated to be durable. We conducted
numerous studies to understand the molecular mechanisms of different types of stripe rust resistance using a transcriptomics
approach. Through comparing gene expression patterns with race-specific, all-stage resistance controlled by
various genes, we found that a greater diversity of genes is involved in HTAP resistance than in all-stage resistance. The
genes involved in HTAP resistance are induced more slowly and their expression induction is less dramatic than genes involved
in all-stage resistance. The high diversity of genes and less dramatic induction may explain durability and the incomplete
expression level of HTAP resistance. Identification of transcripts may be helpful in identifying resistance controlled
by different genes and in selecting better combinations of genes to combine for achieving adequate and durable resistance.
Keywords: Durable resistance, Genechips, Gene expression, Microarray, Puccinia striiformis, Yellow rust
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